مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3785339

Title :

Foreword

Author :

S. Goto;S. Asai

Author_Institution :

Application System Research Laboratory, C &

Volume :

Issue :

fYear :

1987

Keywords :

"Design automation","Very large scale integration","Logic devices","Computational modeling","Research and development","Physics","Compaction","Circuit faults","Particle beam optics","Resists"

Journal_Title :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Publisher :

ieee

ISSN :

0278-0070

Type :

jour

DOI :

10.1109/TCAD.1987.1270274

Filename :

1270274

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3785339