DocumentCode
3785582
Title
Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author
K.L. Pey;M.K. Radhakrishnan;A. Trigg
Volume
4
Issue
1
fYear
2004
Firstpage
4
Lastpage
4
Journal_Title
IEEE Transactions on Device and Materials Reliability
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2004.826387
Filename
1284291
Link To Document