DocumentCode :
3785582
Title :
Expanded Papers From the 2003 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author :
K.L. Pey;M.K. Radhakrishnan;A. Trigg
Volume :
4
Issue :
1
fYear :
2004
Firstpage :
4
Lastpage :
4
Journal_Title :
IEEE Transactions on Device and Materials Reliability
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2004.826387
Filename :
1284291
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3785582
