Title :
Errata to “Identification and Classification of Single-Event Upsets in the Configuration Memory of SRAM-Based FPGAs”
Author :
M. Ceschia;M. Violante;M. SonzaReorda;A. Paccagnella;P. Bernardi;M. Rebaudengo;D. Bortolato;M. Bellato;P. Zambolin;A. Candelori
Keywords :
"Single event upset","Curve fitting","Circuits"
Journal_Title :
IEEE Transactions on Nuclear Science
DOI :
10.1109/TNS.2004.827944
