DocumentCode :
3785766
Title :
Guest Editorial Special Section on the International Conference on Microelectronic Test Structures
Author :
B. Verzi;A.J. Walton
Volume :
17
Issue :
2
fYear :
2004
Firstpage :
77
Lastpage :
78
Keywords :
"Microelectronics","Semiconductor device testing","Isolation technology","Manufacturing processes","Software testing","Fabrication","Circuit testing","Pulp manufacturing","Production","Semiconductor device manufacture"
Journal_Title :
IEEE Transactions on Semiconductor Manufacturing
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2004.826931
Filename :
1296709
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3785766
