• DocumentCode
    378583
  • Title

    Leaky surface acoustic waves on langasite with thin dielectric films

  • Author

    Kakio, Shoji ; Yamaguchi, Tamie ; Nakagawa, Yasuhiko

  • Author_Institution
    Fac. of Eng., Yamanashi Univ., Kofu, Japan
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    165
  • Abstract
    The propagation characteristics of leaky surface acoustic waves on rotated Y-cut langasite with a thin dielectric film, such as those of tantalum pentoxide (Ta2O5) and silicon dioxide (SiO2), are investigated theoretically and experimentally, mainly in terms of the attenuation. The theoretical analysis showed that, for a certain range of the cut angle, the attenuation can be reduced by choosing the appropriate material and thickness of the film. In fact, the estimated propagation loss of the leaky surface acoustic wave on (0°, 140°, 67°)-cut langasite with RF-sputtered Ta 2O5 film decreased to approximately one-third in comparison to those of the sample without the thin film
  • Keywords
    dielectric thin films; gallium compounds; lanthanum compounds; sputtered coatings; surface acoustic waves; La3Ga5SiO14; RF sputtering; SiO2; Ta2O5; attenuation; dielectric thin film; langasite; leaky surface acoustic wave; propagation loss; silicon dioxide; tantalum pentoxide; Acoustic propagation; Acoustic waves; Attenuation; Dielectric films; Dielectric substrates; Dielectric thin films; Propagation losses; Surface acoustic wave devices; Surface acoustic waves; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2001 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-7177-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2001.991601
  • Filename
    991601