Dependence of AlGaN-based SAW oscillator frequency on temperature

A SAW delay-line oscillator based on an Al/sub x/Ga/sub 1-x/N-on-sapphire structure is presented, and its frequency dependence on temperature has been measured. The temperature coefficient of frequency -69 ppm/K has been found for the Al/sub x/Ga/sub 1-x/N layer thickness 1.7 /spl mu/m, Al molar amount x=0.5, and operation frequency 226 MHz.