DocumentCode :
3785948
Title :
Digital Logic Testing and Simulation, second edition [Book Review]
Author :
D. Nikolos
Volume :
7
Issue :
2
fYear :
2004
Firstpage :
78
Lastpage :
79
Keywords :
"Book reviews","Logic testing","Circuit testing","Circuit simulation","Built-in self-test","Instruments","Formal verification","Automatic test pattern generation","Design for testability","Clocks"
Journal_Title :
IEEE Instrumentation & Measurement Magazine
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2004.1304576
Filename :
1304576
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3785948
