• DocumentCode
    378642
  • Title

    Dispersion of surface acoustic waves on rough anisotropic materials

  • Author

    Flannery, C.M. ; von Kiedrowski, H.

  • Author_Institution
    Paul Drude Inst. for Solid State Electron., Berlin, Germany
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    583
  • Abstract
    The effect of surface roughness on adhesion and tribological properties of films and interfaces is of key importance. Therefore it is of the utmost importance to be able to measure this quantity and to predict the perturbing effects different roughness levels may cause. Roughness is known to affect the propagation of surface acoustic waves on a material but there is little useful quantitative data on the topic. This work investigates the dispersive effect of roughness on surface acoustic wavepackets (30-200 MHz frequency range) for different degrees of nanometer roughness on silicon (001) and (111) surfaces. We show that the dispersion effect is significant, and that although available theory agrees qualitatively with the results, the theory is not adequate to predict the real SAW dispersion. These experimental results have considerable implications for design of SAW devices, for accuracy of Brillouin spectroscopy measurements and for possible applications to non destructive testing. Previously unknown dispersive effects on anisotropic crystal surfaces are also demonstrated and an empirical modelling approach is discussed
  • Keywords
    acoustic dispersion; anisotropic media; elemental semiconductors; rough surfaces; silicon; surface acoustic waves; 30 to 200 MHz; Si; rough anisotropic material; silicon [001] surface; silicon [111] surface; surface acoustic wave dispersion; Acoustic measurements; Acoustic propagation; Acoustic waves; Adhesives; Anisotropic magnetoresistance; Dispersion; Rough surfaces; Surface acoustic wave devices; Surface acoustic waves; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2001 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-7177-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2001.991689
  • Filename
    991689