• DocumentCode
    3786993
  • Title

    Correction to "On the Modeling of Surface Roughness Limited Mobility in SOI MOSFETs and its Correlation to the Transistor Effective Field"

  • Volume
    51
  • Issue
    12
  • fYear
    2004
  • Firstpage
    2256
  • Lastpage
    2256
  • Journal_Title
    IEEE Transactions on Electron Devices
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2004.839257
  • Filename
    1362998