مرکز منطقه ای اطلاع رساني علوم و فناوري - Correction to "On the Modeling of Surface Roughness Limited Mobility in SOI MOSFETs and its Correlation to the Transistor Effective Field"

DocumentCode :

3786993

Title :

Correction to "On the Modeling of Surface Roughness Limited Mobility in SOI MOSFETs and its Correlation to the Transistor Effective Field"

Volume :

51

Issue :

12

fYear :

2004

Firstpage :

2256

Lastpage :

2256

Journal_Title :

IEEE Transactions on Electron Devices

Publisher :

ieee

ISSN :

0018-9383

Type :

jour

DOI :

10.1109/TED.2004.839257

Filename :

1362998

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3786993

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