DocumentCode :
3787119
Title :
Introduction to the Special Issue on Nonvolatile Memory Reliability
Author :
P. Cappelletti;P. Pavan
Volume :
4
Issue :
3
fYear :
2004
Firstpage :
299
Lastpage :
300
Keywords :
"Special issues and sections","Nonvolatile memory","Flash memory","Materials reliability","Random access memory","Educational institutions","Home appliances","Semiconductor memory","EPROM","Physics"
Journal_Title :
IEEE Transactions on Device and Materials Reliability
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2004.837116
Filename :
1369189
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3787119
