• DocumentCode
    3787119
  • Title

    Introduction to the Special Issue on Nonvolatile Memory Reliability

  • Author

    P. Cappelletti;P. Pavan

  • Volume
    4
  • Issue
    3
  • fYear
    2004
  • Firstpage
    299
  • Lastpage
    300
  • Keywords
    "Special issues and sections","Nonvolatile memory","Flash memory","Materials reliability","Random access memory","Educational institutions","Home appliances","Semiconductor memory","EPROM","Physics"
  • Journal_Title
    IEEE Transactions on Device and Materials Reliability
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2004.837116
  • Filename
    1369189
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3787119