3787168

Guest Editorial

G.G.E. Gielen;J. Figueras

24

1

2005

1

3

"Circuit testing","Power system reliability","Design methodology","Design automation","Automatic testing","Dynamic voltage scaling","Frequency","Isolation technology","Electronic design automation and methodology","Software testing"

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ieee

0278-0070

jour

10.1109/TCAD.2004.841328

1372656