DocumentCode
37873
Title
The 3v Fallacy: Measuring a Small Number of Samples
Author
Schmid, Heinz ; Huber, Alex
Author_Institution
Institute of Microelectronics, University of Applied Sciences Norhtwestern Switzerland, Windisch, 5210, Switzerland
Volume
15
Issue
7
fYear
2014
fDate
Nov.-Dec. 2014
Firstpage
68
Lastpage
74
Abstract
Many solid-state circuits papers today report the mean n and the standard deviation v of measurement results obtained from a small number of test chips and then compare them with numbers other authors obtained. Almost none of them discuss confidence intervals, ranges of values for that standard deviation within which the true value lies with a certain probability. Many implicitly assume that the n! 3v range would contain all but 0.27% of chip samples to be expected in volume production. This is incorrect even if it is certain that the measured quantity is exactly normal distributed.
Keywords
Error probability; Gaussian distribution; Semiconductor device measurement; Solid state circuits; Temperature sensors; Tutorials;
fLanguage
English
Journal_Title
Microwave Magazine, IEEE
Publisher
ieee
ISSN
1527-3342
Type
jour
DOI
10.1109/MMM.2014.2355954
Filename
6954445
Link To Document