• DocumentCode
    378750
  • Title

    Reduction of dross formation during wave soldering using lead-free solders

  • Author

    Takemoto, T. ; Joo, Yeon Jun ; Mawatari, Shohei ; Kato, Rikiya

  • Author_Institution
    Collaborative Res. Center foe Adv. Sci. & Technol., Osaka Univ., Japan
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1131
  • Lastpage
    1136
  • Abstract
    To reduce the dross formation rate during wave soldering, the addition of trace elements in to lead-free solder and the development of a new equipment have been investigated. The dross formation test was conducted by using a small wave solder bath maintained at 250°C and also the test was performed on a wave soldering machine for production line scale. The small addition of germanium and also phosphorous reduced the dross formation rate of Sn-3.5Ag. Chemical analysis of dross revealed that the trace elements added concentrated in the dross, about 2~9 times higher than the added amount for germanium and more than 4.5 times for phosphorus. The main oxide of dross was found to be SnO, and the oxygen content of dross is about 5 at %; that is about 90% of dross is constituted from metal. To reduce the dross during wave soldering operation, a new instrument attachable to wave soldering machine was evaluated. About 50% reduction of weight of dross was achieved by using this instruments
  • Keywords
    germanium; phosphorus; printed circuit manufacture; silver alloys; tin alloys; wave soldering; 250 C; O content; SnAg:Ge; SnAg:P; SnO; chemical analysis; dross formation rate reduction; lead-free solder; production line scale; trace elements; wave soldering bath; wave soldering machine; Chemical analysis; Chemical elements; Environmentally friendly manufacturing techniques; Germanium; Instruments; Lead; Performance evaluation; Production; Soldering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmentally Conscious Design and Inverse Manufacturing, 2001. Proceedings EcoDesign 2001: Second International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-7695-1266-6
  • Type

    conf

  • DOI
    10.1109/.2001.992540
  • Filename
    992540