DocumentCode :
3787601
Title :
Testing: It´s not just pass/fail anymore
Author :
S. Davidson
Author_Institution :
Sun Microsystems
Volume :
22
Issue :
1
fYear :
2005
Firstpage :
80
Lastpage :
80
Keywords :
"Testing","Sun"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2005.22
Filename :
1401830
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3787601
