DocumentCode :
378762
Title :
Evaluating low-cost fault-tolerance mechanism for microprocessors on multimedia applications
Author :
Sato, Toshinori ; Arita, Itsujiro
Author_Institution :
Dept. of Artificial Intelligence, Kyushu Inst. of Technol., Japan
fYear :
2001
fDate :
2001
Firstpage :
225
Lastpage :
232
Abstract :
We evaluate a low-cost fault-tolerance mechanism for microprocessors, which can detect and recover from transient faults, using multimedia applications. There are two driving forces to study fault-tolerance techniques for microprocessors. One is deep submicron fabrication technologies. Future semiconductor technologies could become more susceptible to alpha particles and other cosmic radiation. The other is the increasing popularity of mobile platforms. Recently cell phones have been used for applications which are critical to our financial security, such as flight ticket reservation, mobile banking, and mobile trading. In such applications, it is expected that computer systems will always work correctly. From these observations, we propose a mechanism which is based on an instruction reissue technique for incorrect data speculation recovery which utilizes time redundancy. Unfortunately, we found significant performance loss when we evaluated the proposal using the SPEC2000 benchmark suite. We evaluate it using MediaBench which contains more practical mobile applications than SPEC2000
Keywords :
fault tolerant computing; instruction sets; multimedia systems; system recovery; MediaBench; SPEC2000 benchmark suite; cell phones; computer systems; deep submicron fabrication technologies; financial security; flight ticket reservation; incorrect data speculation recovery; instruction reissue technique; low-cost fault-tolerance mechanism evaluation; microprocessors; mobile applications; mobile banking; mobile platforms; mobile trading; multimedia applications; performance loss; time redundancy; transient fault recovery; Alpha particles; Application software; Banking; Cellular phones; Data security; Fabrication; Fault detection; Fault tolerance; Microprocessors; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Computing, 2001. Proceedings. 2001 Pacific Rim International Symposium on
Conference_Location :
Seoul
Print_ISBN :
0-7695-1414-6
Type :
conf
DOI :
10.1109/PRDC.2001.992702
Filename :
992702
Link To Document :
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