DocumentCode :
3787638
Title :
Facing risk: stop, look and listen
Author :
W.H. Shaw
Author_Institution :
Florida Institute of Technology
Volume :
33
Issue :
1
fYear :
2005
Firstpage :
2
Lastpage :
3
Keywords :
"Risk management","Uncertainty","Project management","Humans","Costs","Planets","Eyes","Home computing","Technology management"
Journal_Title :
IEEE Engineering Management Review
Publisher :
ieee
ISSN :
0360-8581
Type :
jour
DOI :
10.1109/EMR.2005.1404534
Filename :
1404534
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3787638
