DocumentCode :
3788162
Title :
Testing of Digital Systems [Book Review]
Author :
G. Di Cataldo
Volume :
21
Issue :
3
fYear :
2005
Firstpage :
52
Lastpage :
53
Keywords :
"Book reviews","System testing","Digital systems","Circuit testing","Materials testing","Automatic testing","Circuit faults","Quantum mechanics","Manufacturing","Costs"
Journal_Title :
IEEE Circuits and Devices Magazine
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2005.1438814
Filename :
1438814
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3788162
