• DocumentCode
    3788162
  • Title

    Testing of Digital Systems [Book Review]

  • Author

    G. Di Cataldo

  • Volume
    21
  • Issue
    3
  • fYear
    2005
  • Firstpage
    52
  • Lastpage
    53
  • Keywords
    "Book reviews","System testing","Digital systems","Circuit testing","Materials testing","Automatic testing","Circuit faults","Quantum mechanics","Manufacturing","Costs"
  • Journal_Title
    IEEE Circuits and Devices Magazine
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/MCD.2005.1438814
  • Filename
    1438814
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3788162