Title :
Ferroelectric-based functional pass-gate for fine-grain pipelined VLSI computation
Author :
Hanyu, T. ; Kimura, H. ; Kameyama, M. ; Fujimori, Y. ; Nakamura, T. ; Takasu, H.
Author_Institution :
Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan
Abstract :
The state-transition scheme of remnant polarization in a ferroelectric capacitor performs storage and switching functions simultaneously with a functional pass-gate. As an example of fine-grain pipelined VLSI computation, a 250 MHz 54/spl times/54 b pipelined multiplier has 2.5 W estimated power dissipation in a 0.6 /spl mu/m ferroelectric/CMOS technology.
Keywords :
CMOS integrated circuits; VLSI; ferroelectric devices; integrated logic circuits; logic design; microprocessor chips; parallel architectures; pipeline processing; 0.6 /spl mu/m ferroelectric CMOS technology; 0.6 micron; 2.5 W; 2.5 W power dissipation; 250 MHz; ULSI; distributed pipeline registers; ferroelectric-based functional pass-gate; fine-grain pipelined VLSI processors; fine-grain pipelined architecture; high-throughput FIFOs; logic-circuit plane; Adders; Capacitors; Clocks; Ferroelectric devices; Ferroelectric materials; Latches; MOSFETs; Pipelines; Very large scale integration; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.993009
