DocumentCode :
3788409
Title :
Comment on "Microwave measurement of conductivity and dielectric constant of semiconductors"
Author :
K.S. Champlin;B.R. Nag
Author_Institution :
University of Minnesota, Minneapolis, Minn.
Volume :
52
Issue :
9
fYear :
1964
Firstpage :
1061
Lastpage :
1062
Keywords :
"Conductivity measurement","Dielectric measurements","Microwave measurements","Dielectric constant","Conductors","Antenna measurements","Space technology","Waveguide theory","Gunn devices","Propagation constant"
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.3259
Filename :
1445189
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3788409
