3788631

Comment on "z-form technique"

R.N. McDonough;S. Lees

Bell Telephone Laboratories, Inc., Whippany, N.J.

54

11

1966

1616

1617

"Scattering parameters","Stability criteria","Frequency","Reflection","Biomedical engineering","Impedance","Transient response","Microwave transistors","Microwave measurements","Gain measurement"

Proceedings of the IEEE

ieee

0018-9219

jour

10.1109/PROC.1966.5228

1447158