DocumentCode
378929
Title
Outage-based admission region in multi-class cellular systems
Author
Javidi, Tara ; Teneketzis, Demosthenis
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume
1
fYear
2002
fDate
17-21 Mar 2002
Firstpage
124
Abstract
We present an approach to defining probability of outage as a system-wide QoS measure for cellular systems. We describe how to use this approach to define an admission region where the requirements on probability of outage are satisfied. We illustrate the approach by constructing the aforementioned admission region for a few examples.
Keywords
cellular radio; probability; quality of service; admission region; multi-class cellular systems; outage probability; system-wide QoS measure; Bit error rate; Electric variables measurement; Fading; Interference; Land mobile radio cellular systems; Probability; Quality of service; Signal to noise ratio; Telecommunication traffic; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Wireless Communications and Networking Conference, 2002. WCNC2002. 2002 IEEE
Print_ISBN
0-7803-7376-6
Type
conf
DOI
10.1109/WCNC.2002.993476
Filename
993476
Link To Document