• DocumentCode
    3789420
  • Title

    Comments on "Simultaneous determination of device noise and gain parameters through noise measurements only"

  • Author

    K. Mishima;Y. Sawayama;M. Sannino

  • Author_Institution
    Toshiba Corporation, Kawasaki, Japan
  • Volume
    70
  • Issue
    1
  • fYear
    1982
  • Firstpage
    100
  • Lastpage
    101
  • Keywords
    "Noise measurement","Noise figure","Gain measurement","Isolators","Acoustic noise","System testing","Admittance measurement","Power measurement","Voltage","Acoustic reflection"
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1982.12245
  • Filename
    1456513
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3789420