DocumentCode :
3789420
Title :
Comments on "Simultaneous determination of device noise and gain parameters through noise measurements only"
Author :
K. Mishima;Y. Sawayama;M. Sannino
Author_Institution :
Toshiba Corporation, Kawasaki, Japan
Volume :
70
Issue :
1
fYear :
1982
Firstpage :
100
Lastpage :
101
Keywords :
"Noise measurement","Noise figure","Gain measurement","Isolators","Acoustic noise","System testing","Admittance measurement","Power measurement","Voltage","Acoustic reflection"
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1982.12245
Filename :
1456513
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3789420
