DocumentCode :
3789692
Title :
Design of testable logic circuits
Author :
P.S. Bottorff
Author_Institution :
IBM Corporation Laboratory, Endicott, NY
Volume :
74
Issue :
1
fYear :
1986
Firstpage :
235
Lastpage :
235
Keywords :
"Circuit testing","Logic testing","Logic circuits","Books","Controllability","Observability","Software testing","Automatic testing","Logic design","Design engineering"
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1986.13449
Filename :
1457717
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3789692