3790097

Comments on "Depletion approximation analysis of the differential capacitance-voltage characteristics of an MOS structure with nonuniformly doped semiconductors"

R.R. O´Brien

IBM Corporation, Hopewell Junction, NY

27

9

1980

1848

1849

IEEE Transactions on Electron Devices

ieee

0018-9383

jour

10.1109/T-ED.1980.20117

1480910