• DocumentCode
    3790106
  • Title

    Corrections to "A quantitative model of the effect of grain size on the resistivity of polycrystalline silicon resistors"

  • Author

    N.C.C. Lu;L. Gerzberg;J.D. Meindl

  • Author_Institution
    Stanford University, Stanford, California
  • Volume
    1
  • Issue
    9
  • fYear
    1980
  • Firstpage
    185
  • Lastpage
    185
  • Keywords
    "Grain size","Conductivity","Silicon","Resistors","Reproducibility of results","Photovoltaic cells","Coatings"
  • Journal_Title
    IEEE Electron Device Letters
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1980.25282
  • Filename
    1481144
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3790106