مرکز منطقه ای اطلاع رساني علوم و فناوري - Comments on "Determination of the minority-carrier base lifetime of junction transistors by measurement of basewidth-modulation conductances"

DocumentCode :

3790107

Title :

Comments on "Determination of the minority-carrier base lifetime of junction transistors by measurement of basewidth-modulation conductances"

Author :

Ming-Guang Yi

Author_Institution :

Research Institute of Semicoductor Devices, Peking, China

Volume :

Issue :

fYear :

1981

Firstpage :

124

Lastpage :

124

Journal_Title :

IEEE Transactions on Electron Devices

Publisher :

ieee

ISSN :

0018-9383

Type :

jour

DOI :

10.1109/T-ED.1981.20295

Filename :

1481447

Link To Document :