DocumentCode :
3790124
Title :
Corrections to "Discharging process by multiple tunnelings in MNOS structures"
Author :
H. Yamamoto;H. Iwasawa;A. Sasaki
Volume :
2
Issue :
5
fYear :
1981
Firstpage :
132
Lastpage :
132
Keywords :
"Tunneling","Charge coupled devices","Charge-coupled image sensors","Silicon","Interface states"
Journal_Title :
IEEE Electron Device Letters
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1981.25369
Filename :
1481853
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790124
