DocumentCode

3790184

Title

A novel scheme to measure the interface trap density near band edges using CCD´s

Author

D.L. Carter

Volume

32

Issue

5

fYear

1985

Firstpage

1003

Lastpage

1003

Journal_Title

IEEE Transactions on Electron Devices

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1985.22064

Filename

1484810