DocumentCode :
3790184
Title :
A novel scheme to measure the interface trap density near band edges using CCD´s
Author :
D.L. Carter
Volume :
32
Issue :
5
fYear :
1985
Firstpage :
1003
Lastpage :
1003
Journal_Title :
IEEE Transactions on Electron Devices
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.22064
Filename :
1484810
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790184
