DocumentCode :
3790190
Title :
Correction to "Measurement of diffusion length, lifetime, and surface recombination velocity in thin semiconductor layers"
Author :
F.N. Gonzalez;A. Neugroschel
Volume :
32
Issue :
11
fYear :
1985
Firstpage :
2511
Lastpage :
2512
Journal_Title :
IEEE Transactions on Electron Devices
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.22306
Filename :
1485052
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790190
