DocumentCode :
3790220
Title :
Comment on "An accurate method to extract specific contact resistivity using cross-bridge Kelvin resistors"
Author :
H.B. Harrison;G.K. Reeves
Author_Institution :
IBM T.J. Watson Research Laboratories, Yorktown Heights, NY
Volume :
7
Issue :
2
fYear :
1986
Firstpage :
142
Lastpage :
142
Keywords :
"Conductivity","Kelvin","Resistors","Contact resistance","Electrical resistance measurement","Testing","Australia","Error correction","Geometry","Laboratories"
Journal_Title :
IEEE Electron Device Letters
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1986.26322
Filename :
1486145
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790220
