مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3790225

Title :

Errata

Author :

S.M. Sze

Volume :

Issue :

fYear :

1986

Firstpage :

458

Lastpage :

458

Keywords :

"Silicon on insulator technology","FETs","Threshold voltage","Leakage current","Transconductance","JFET integrated circuits","Integrated circuit technology","Application specific integrated circuits","Impact ionization","Degradation"

Journal_Title :

IEEE Electron Device Letters

Publisher :

ieee

ISSN :

0741-3106

Type :

jour

DOI :

10.1109/EDL.1986.26436

Filename :

1486259

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790225