• DocumentCode
    3790425
  • Title

    Guest Editorial

  • Author

    T. Chen;D. DeVenuto

  • Volume
    24
  • Issue
    9
  • fYear
    2005
  • Firstpage
    1313
  • Lastpage
    1314
  • Keywords
    "Design automation","Design methodology","Timing","Electromigration","Voltage","Robustness","Consumer electronics","Time to market","Circuit faults","Delay"
  • Journal_Title
    IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.855880
  • Filename
    1501896