مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3790425

Title :

Guest Editorial

Author :

T. Chen;D. DeVenuto

Volume :

Issue :

fYear :

2005

Firstpage :

1313

Lastpage :

1314

Keywords :

"Design automation","Design methodology","Timing","Electromigration","Voltage","Robustness","Consumer electronics","Time to market","Circuit faults","Delay"

Journal_Title :

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Publisher :

ieee

ISSN :

0278-0070

Type :

jour

DOI :

10.1109/TCAD.2005.855880

Filename :

1501896

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790425