DocumentCode
3790425
Title
Guest Editorial
Author
T. Chen;D. DeVenuto
Volume
24
Issue
9
fYear
2005
Firstpage
1313
Lastpage
1314
Keywords
"Design automation","Design methodology","Timing","Electromigration","Voltage","Robustness","Consumer electronics","Time to market","Circuit faults","Delay"
Journal_Title
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2005.855880
Filename
1501896
Link To Document