DocumentCode :
3790638
Title :
Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing—Future of Semiconductor Test
Author :
S.R. Das;R. Rajsuman
Volume :
54
Issue :
5
fYear :
2005
Firstpage :
1659
Lastpage :
1661
Keywords :
"Semiconductor device testing","Sections","Very large scale integration","Automatic testing","Electronic equipment testing","Circuit testing","Logic testing","Costs","Radio frequency","Instruments"
Journal_Title :
IEEE Transactions on Instrumentation and Measurement
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2005.857481
Filename :
1514615
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3790638
