3791147

VLSI - Designer´s interface

D.W. Bouldin

21

6

2005

3

4

"Very large scale integration","Automatic testing","System testing","MOSFETs","Application specific integrated circuits","Digital signal processing","Field programmable gate arrays","Logic","Semiconductor device modeling","Software libraries"

IEEE Circuits and Devices Magazine

ieee

8755-3996

jour

10.1109/MCD.2005.1578581

1578581