DocumentCode :
3791494
Title :
Advances in circuits and systems
Volume :
6
Issue :
1
fYear :
2006
Firstpage :
62
Lastpage :
62
Keywords :
"Circuits and systems","Logic testing","Phase locked loops","Circuit testing","Radio frequency","Jitter","Frequency domain analysis","Phase noise","Source separation","Circuit noise"
Journal_Title :
IEEE Circuits and Systems Magazine
Publisher :
ieee
ISSN :
1531-636X
Type :
jour
DOI :
10.1109/MCAS.2006.1607639
Filename :
1607639
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3791494
