• DocumentCode
    3791494
  • Title

    Advances in circuits and systems

  • Volume
    6
  • Issue
    1
  • fYear
    2006
  • Firstpage
    62
  • Lastpage
    62
  • Keywords
    "Circuits and systems","Logic testing","Phase locked loops","Circuit testing","Radio frequency","Jitter","Frequency domain analysis","Phase noise","Source separation","Circuit noise"
  • Journal_Title
    IEEE Circuits and Systems Magazine
  • Publisher
    ieee
  • ISSN
    1531-636X
  • Type

    jour

  • DOI
    10.1109/MCAS.2006.1607639
  • Filename
    1607639
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3791494