DocumentCode :
3791540
Title :
Guest Editorial Second Special Section of the IEEE Transactions on Instrumentation and Measurement in the Area of VLSI Testing—Future of Semiconductor Test
Author :
S.R. Das;R. Rajsuman
Volume :
55
Issue :
2
fYear :
2006
Firstpage :
378
Lastpage :
380
Keywords :
"Semiconductor device testing","Sections","Very large scale integration","Circuit testing","Integrated circuit testing","System testing","Built-in self-test","Logic testing","Integrated circuit measurements","Transceivers"
Journal_Title :
IEEE Transactions on Instrumentation and Measurement
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2006.873383
Filename :
1608578
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3791540
