DocumentCode :
3791915
Title :
TC news - Fall 2005 committee reports
Author :
R. Hochberg
Volume :
9
Issue :
2
fYear :
2006
Firstpage :
4
Lastpage :
15
Keywords :
"Standards development","Frequency","Instrumentation and measurement","Metrology","Recruitment","Instruments","Area measurement","System testing","Documentation","Nanotechnology"
Journal_Title :
IEEE Instrumentation & Measurement Magazine
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2006.1634977
Filename :
1634977
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3791915
