DocumentCode :
3791920
Title :
Conference report - low-down
Author :
B.P. Shan
Volume :
25
Issue :
1
fYear :
2006
Firstpage :
45
Lastpage :
45
Keywords :
"Fault tolerance","Computer errors","Application software","Redundancy","Systems engineering and theory","Fault detection","Safety","Control system synthesis","Multidimensional systems","Codes"
Journal_Title :
IEEE Potentials
Publisher :
ieee
ISSN :
0278-6648
Type :
jour
DOI :
10.1109/MP.2006.1635030
Filename :
1635030
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3791920
