Title :
Incorporating fault tolerance in analog-to-digital converters (ADCs)
Author :
Singh, Mandeep ; Koren, Israel
Author_Institution :
Adv. Micro Devices Inc., Austin, TX, USA
Abstract :
The reliability of ADCs used in highly critical systems can be increased by applying a two-step procedure starting with sensitivity analysis followed by redesign. The sensitivity analysis is used to identify the most sensitive blocks which could then be redesigned for better reliability by incorporating fault tolerance. This paper illustrates the steps involved in incorporating fault tolerance in an ADC. Two redesign techniques to improve the reliability of a circuit are presented. Novel selective node resizing algorithms for increased tolerance against α-particle induced transients are discussed.
Keywords :
alpha-particle effects; analogue-digital conversion; delta-sigma modulation; fault tolerance; integrated circuit design; integrated circuit reliability; sensitivity analysis; ADC fault tolerance; ADC reliability; alpha-particle induced transients tolerance; analog-to-digital converters; critical systems; delta-sigma ADC; fault sensitivity analysis; redesign techniques; selective node resizing algorithms; successive approximation architecture; two-step procedure; Aerospace electronics; Analog-digital conversion; Analytical models; Circuit faults; Electrical capacitance tomography; Fault diagnosis; Fault tolerance; Fault tolerant systems; Hardware; Sensitivity analysis;
Conference_Titel :
Quality Electronic Design, 2002. Proceedings. International Symposium on
Print_ISBN :
0-7695-1561-4
DOI :
10.1109/ISQED.2002.996753
