DocumentCode :
3795587
Title :
VLSI Designer´s interface
Author :
D.W. Bouldin
Volume :
22
Issue :
4
fYear :
2006
Firstpage :
8
Lastpage :
9
Keywords :
"Very large scale integration","Web server","Circuit testing","Circuit faults","Internet","Routing","Systolic arrays","Integrated circuit technology","Semiconductor device measurement","Integrated circuit measurements"
Journal_Title :
IEEE Circuits and Devices Magazine
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2006.1708369
Filename :
1708369
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3795587
