Automatic digital correction of measurement data based on M-point autocalibration and inverse polynomial approximation

A microprocessor-controlled measurement system model comprising m-point autocalibration and inverse polynomial approximation of the measurement-system transfer characteristics is described. A voltage-to-frequency converter is used for an analog-to-digital conversion of an input quantity. The model is restricted to measurements of slow-varying analog input quantities, and it is suitable for application in severe temperature conditions, common to a variety of industrial environments. By utilizing the computing power of microprocessors, a higher accuracy of measurements can be achieved with low-performance electronic components.