Title :
Pseudoexhaustive test pattern generator with enhanced fault coverage
Author :
P. Golan;O. Novak;J. Hlavicka
Author_Institution :
Res. Inst. for Math. Machines, Prague, Czechoslovakia
Abstract :
A method of pseudoexhaustive test pattern generation is proposed that is suitable above all for circuits using random access scan. Two linear feedback shift registers are used to generate scan addresses and test patterns to be scanned into these addresses. It is shown that the method gives better results than random testing.
Keywords :
"Test pattern generators","Circuit testing","Circuit faults","Automatic testing","Linear feedback shift registers","Built-in self-test","Combinational circuits","Polynomials","Linear code","Design for testability"
Journal_Title :
IEEE Transactions on Computers
