• DocumentCode
    3795757
  • Title

    Pseudoexhaustive test pattern generator with enhanced fault coverage

  • Author

    P. Golan;O. Novak;J. Hlavicka

  • Author_Institution
    Res. Inst. for Math. Machines, Prague, Czechoslovakia
  • Volume
    37
  • Issue
    4
  • fYear
    1988
  • Firstpage
    496
  • Lastpage
    500
  • Abstract
    A method of pseudoexhaustive test pattern generation is proposed that is suitable above all for circuits using random access scan. Two linear feedback shift registers are used to generate scan addresses and test patterns to be scanned into these addresses. It is shown that the method gives better results than random testing.
  • Keywords
    "Test pattern generators","Circuit testing","Circuit faults","Automatic testing","Linear feedback shift registers","Built-in self-test","Combinational circuits","Polynomials","Linear code","Design for testability"
  • Journal_Title
    IEEE Transactions on Computers
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.2198
  • Filename
    2198
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3795757