DocumentCode :
3795812
Title :
Double-interdigitated power transistors
Author :
A.P. Silard;G. Nani;F. Floru;C. Stefan
Author_Institution :
Dept. of Electron., Polytech. Inst., Bucharest, Romania
Volume :
35
Issue :
8
fYear :
1988
Firstpage :
1364
Lastpage :
1371
Abstract :
The results of a comprehensive investigation concerning the implementation of the double-interdigitated (TIL) concept in TO-3-packaged triple-diffused power n-p-n/sup -/-n transistors are reported. The ease of manufacturing is accompanied by a relaxation of the tradeoff between the doping and width of the p-base and the main transistor parameters, which is still a crucial issue in conventionally interdigitated switches. The advantages exhibited by TIL devices when compared with identical conventional interdigitated transistors processed simultaneously are discussed.
Keywords :
"Power transistors","Electrothermal effects","Voltage","Switches","Silicon","Delay","Costs","Manufacturing","Equivalent circuits"
Journal_Title :
IEEE Transactions on Electron Devices
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.2560
Filename :
2560
Link To Document :
بازگشت