DocumentCode :
3796590
Title :
R64-79 Tunnel Diode Storage System with Non-Destructive Read-Out
Author :
Joseph F. Kruy
Author_Institution :
Honeywell?EDP Division
Issue :
6
fYear :
1964
Firstpage :
761
Lastpage :
761
Keywords :
"Diodes","Error correction","Computer errors","Redundancy","Logic","Circuits","Voltage","Testing","Signal design","Costs"
Journal_Title :
IEEE Transactions on Electronic Computers
Publisher :
ieee
ISSN :
0367-7508
Type :
jour
DOI :
10.1109/PGEC.1964.263710
Filename :
4038330
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3796590
