DocumentCode :
37966
Title :
Analysis of Optical and Electrical Tradeoffs of Traveling-Wave Depletion-Type Si Mach–Zehnder Modulators for High-Speed Operation
Author :
Petousi, Despoina ; Zimmermann, Lars ; Gajda, Andrzej ; Kroh, Marcel ; Voigt, Karsten ; Winzer, Georg ; Tillack, Bernd ; Petermann, Klaus
Author_Institution :
IHP, Frankfurt (Oder), Germany
Volume :
21
Issue :
4
fYear :
2015
fDate :
July-Aug. 2015
Firstpage :
199
Lastpage :
206
Abstract :
Fundamental limiting factors regarding high-speed performance of broadband depletion-type silicon (Si) Mach-Zehnder modulators (MZMs) are studied. Optical and electrical measurements of MZMs with traveling wave electrodes (TWE) reveal significant dependences between optoelectrical bandwidth and design parameters. An equivalent circuit model is implemented to fit measured modulator characteristics. Using the model, the limits of TWE depletion-type Si MZM systems are studied under the requirement of specific driving voltage. By comparing phase shifters with different doping concentration or junction position, we explore the fundamental optical and electrical tradeoffs which are limiting high-speed operation.
Keywords :
equivalent circuits; high-speed optical techniques; optical design techniques; optical limiters; optical modulation; optical phase shifters; optical variables measurement; optoelectronic devices; silicon; Si; broadband depletion-type silicon Mach-Zehnder modulators; electrical measurements; equivalent circuit model; fundamental limiting factors; high-speed operation; optical measurements; optoelectrical bandwidth; optoelectrical design parameters; phase shifters; traveling wave electrodes; traveling-wave depletion-type silicon Mach-Zehnder modulators; Bandwidth; Cutoff frequency; Frequency measurement; Modulation; Phase shifters; Silicon; Voltage measurement; Optical modulation; high-speed operation; silicon modulators;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2014.2369516
Filename :
6954452
Link To Document :
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