• DocumentCode
    3796888
  • Title

    A Practical Component Specification and Test Method to Increase the Reliability of Semiconductor Devices

  • Author

    H. Clay Gorton

  • Author_Institution
    Victor Comptometer Corp. Research and Engineering
  • Issue
    4
  • fYear
    1975
  • Firstpage
    356
  • Lastpage
    360
  • Keywords
    "Semiconductor device testing","Semiconductor device reliability","Semiconductor devices","Leakage current","Bonding","Semiconductor diodes","Failure analysis","Stress","Surface contamination","Surface resistance"
  • Journal_Title
    IEEE Transactions on Consumer Electronics
  • Publisher
    ieee
  • ISSN
    0098-3063
  • Type

    jour

  • DOI
    10.1109/TCE.1975.266696
  • Filename
    4042800
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3796888