3796888

A Practical Component Specification and Test Method to Increase the Reliability of Semiconductor Devices

H. Clay Gorton

Victor Comptometer Corp. Research and Engineering

4

1975

356

360

"Semiconductor device testing","Semiconductor device reliability","Semiconductor devices","Leakage current","Bonding","Semiconductor diodes","Failure analysis","Stress","Surface contamination","Surface resistance"

IEEE Transactions on Consumer Electronics

ieee

0098-3063

jour

10.1109/TCE.1975.266696

4042800