Title :
Closed-form crosstalk noise metrics for physical design applications
Author :
Chen, L.H. ; Marek-Sadowska, M.
Author_Institution :
Avant! Corp., Fremont, CA, USA
Abstract :
In this paper we present efficient closed-form formulas to estimate capacitive coupling-induced crosstalk noise for distributed RC coupling trees. The efficiency of our approach stems from the fact that only the five basic operations are used in the expressions: addition (x+y), subtraction (x-y), multiplication (x/spl times/y), division (x/y) and square root (/spl radic/x). The formulas do not require exponent computation or numerical iterations. We have developed closed-form expressions for the peak crosstalk noise amplitude, the peak noise occurring time and the width of the noise waveform. Our approximations are conservative and yet achieve acceptable accuracy. The formulas are simple enough to be used in the inner loops of performance optimization algorithms or as cost functions to guide routers. They capture the influence of coupling direction (near-end and far-end coupling) and coupling location (near-driver and near-receiver).
Keywords :
circuit optimisation; coupled circuits; crosstalk; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; integrated circuit noise; network routing; IC design; approximation accuracy; basic arithmetic operations; capacitive coupling-induced crosstalk noise; closed-form crosstalk noise metrics; closed-form estimation formulas; distributed RC coupling trees; exponent computation; far-end coupling; interconnect coupling noise; near-driver coupling location; near-end coupling direction; near-receiver coupling; noise waveform width; numerical iterations; peak crosstalk noise amplitude; peak noise occurring time; performance optimization algorithms; router cost functions; Circuit noise; Closed-form solution; Cost function; Coupling circuits; Crosstalk; Design optimization; Noise level; Power supplies; Pulse measurements; Space vector pulse width modulation;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris, France
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998392