Title :
New techniques for speeding-up fault-injection campaigns
Author :
Berrojo, L. ; González, I. ; Corno, F. ; Reorda, M. Sonza ; Squillero, G. ; Entrena, L. ; Lopez, C.
Author_Institution :
Alcatel Espacio, SA, Madrid, Spain
Abstract :
Fault-tolerant circuits are currently required in several major application sectors, and a new generation of CAD tools is required to automate the insertion and validation of fault-tolerant mechanisms. This paper outlines the characteristics of a new fault-injection platform and its evaluation in a real industrial environment. The fault-injection platform is mainly used for assessing the correctness and effectiveness of the fault tolerance mechanisms implemented within ASIC and FPGA designs. The platform works on register transfer-level VHDL descriptions which are then synthesized, and is based on commercial tools for VHDL parsing and simulation. It also details techniques devised and implemented within the platform to speed-up fault-injection campaigns. Experimental results are provided, showing the effects of the different techniques, and demonstrating that they are able to reduce the total time required by fault-injection campaigns by at least one order of magnitude
Keywords :
application specific integrated circuits; circuit CAD; fault simulation; fault tolerance; field programmable gate arrays; hardware description languages; technology CAD (electronics); ASIC; CAD tools; FPGA; RT-level VHDL descriptions; VHDL parsing; VHDL simulation; automatic insertion; automatic validation; fault-injection campaigns; fault-injection platform; fault-tolerant circuits; fault-tolerant mechanisms; industrial environment applications; Circuit faults; Costs; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Hardware; Minimization; Process design; Qualifications; Time to market;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998398