DocumentCode :
379765
Title :
Formal verification techniques: industrial status and perspectives
Author :
Moussa, Intissar ; Pacalet, Renaud ; Blasquez, J. ; van Hulst, Marten ; Fedeli, A. ; Borrione, Dominique ; Bricaud, P.
Author_Institution :
TNI-Valiosys France
fYear :
2002
fDate :
2002
Firstpage :
1050
Lastpage :
1050
Keywords :
Application specific integrated circuits; Circuit testing; DH-HEMTs; Delay; Electrical capacitance tomography; Emulation; Formal verification; Graphics; Instruments; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-1471-5
Type :
conf
DOI :
10.1109/DATE.2002.998430
Filename :
998430
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=379765
