Title :
Fault detection and diagnosis using wavelet based transient current analysis
Author :
Bhunia, Swarup ; Roy, Kaushik
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
We present a novel integrated method for fault detection and localization using wavelet transform of transient current (IDD) waveform. The time-frequency resolution property of wavelet helps us detect as well as localize faults in digital CMOS circuits. Experiments performed on an 8-bit ALU show promising results for both detection and localization
Keywords :
CMOS digital integrated circuits; delays; fault location; integrated circuit testing; transients; wavelet transforms; 8-bit ALU; IDD waveform; digital CM´OS circuits; fault location; time-frequency resolution; transient current; wavelet; wavelet transform; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Frequency; Signal resolution; Transient analysis; Wavelet analysis; Wavelet transforms;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-1471-5
DOI :
10.1109/DATE.2002.998474
